[1]李　格.多孔硅结构电镜图像的数字处理[J].常州大学学报(自然科学版),2002,(04):39-41.
　LI Ge.Imaging Processing in Scanning Electron Microscopy Photograph of Porous Si licon[J].Journal of Changzhou University(Natural Science Edition),2002,(04):39-41.
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多孔硅结构电镜图像的数字处理()
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常州大学学报(自然科学版)[ISSN:2095-0411/CN:32-1822/N]

卷:
期数:
2002年04期
页码:
39-41
栏目:
出版日期:
2002-12-25

文章信息/Info

Title:
Imaging Processing in Scanning Electron Microscopy Photograph of Porous Si licon
作者:
李　格
江苏石油化工学院计算机科学与工程系, 江苏常州213016
Author(s):
LI Ge
Department of Computer Science and Technology , Jiangsu Institute of Pet rochemical Technology , Changzhou 213016 , China
关键词:
图像处理; 纹理分析; 多孔化率
Keywords:
imaging processing ; texture analy sis ; porous silicon
分类号:
Q 349.51
文献标志码:
A
摘要:
多孔硅在光电子和传感器领域是一种具有重要应用价值的材料, 多孔硅网络结构的形状纹理直接影响其光学和热学性 能。运用数字图像处理分析方法对多孔硅结构电子显微镜图像(SEM) 进行特征提取, 为多孔化率的测定提供了重要依据。
Abstract:
Porous silicon has important application in the field of photoelect ron and sensors .The porosity of the porous silicon directly influences its optical and electrical properties .In this paper the imaging analysis in SEM photog raph of the porous silicon acting as pyroelectric sensor subst rate w as used to identify the porosity and o ther st ructure characteristics of the porous silicon .

参考文献/References:

[1] 叶好华, 叶志镇, 黄靖云.硅发光研究进展[J] .半导体光 电, 2002 , 23 (1):4 -7.
[2] Li Jinhua , Yuan Ningyi.Propert ies of PT/P (VDF -TrFE)Pyroelect ric Sensor Based on Porous SiO2 Subst rate [J] .SPIE , 2001 , 4 596 :22 -28.
[3] Cast leman .Digital Image Processing [M] .New Jersey :Prentice Hall Inc, 1997 .
[4] Mihran Tuceryan , Anil K Jain .Handbook Pat tern Recogni tion and Computer Vision [M] .Singapore :World S cienti fic Publishing , 1999.235 -376.
[5] 田捷, 沙飞, 张新生.实用图像分析与处理技术[M] .北 京:电子工业出版社, 1995 .
[6] St einer P, Lang W.Micromathining Applications of Porous Si licon [J] .Thin Solid Films , 1995 , 255 :52 -58.

备注/Memo

备注/Memo:
作者简介:李格(1962 - ), 男, 江苏张家港人, 讲师, 硕士, 主要从事理论模拟和图象处理方面的研究。
更新日期/Last Update: 2002-12-25