[1]张小鸣,赵国柱,王秋阳.双机继电保护装置可靠性的影响因素[J].常州大学学报(自然科学版),2011,(02):50-54.
 ZHANG Xiao-ming,ZHAO Guo-zhu,WANG Qiu-yang.Researches on Optimum Self-Test and Routine Test Interval of Relay Protection Equipment[J].Journal of Changzhou University(Natural Science Edition),2011,(02):50-54.
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双机继电保护装置可靠性的影响因素()
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常州大学学报(自然科学版)[ISSN:2095-0411/CN:32-1822/N]

卷:
期数:
2011年02期
页码:
50-54
栏目:
出版日期:
2011-03-30

文章信息/Info

Title:
Researches on Optimum Self-Test and Routine Test Interval of Relay Protection Equipment
作者:
张小鸣赵国柱王秋阳
常州大学 信息科学与工程学院,江苏 常州 213164
Author(s):
ZHANG Xiao-mingZHAO Guo-zhuWANG Qiu-yang
School of Information Science and Engineering,Changzhou University,Changzhou 213164,China
关键词:
可靠性 马尔科夫过程 自检周期 人工检修周期 继电保护
Keywords:
reliability Markov model self-checking interval routine test interval relay protection
分类号:
TM 774
文献标志码:
A
摘要:
为了分析自检和人工检修等因素对双机继电保护装置可靠性的影响,建立基于马尔科夫过程的主、备机双机切换状态转移空间模型。用状态空间法定量分析双机切换状态下,自检周期、自检所花时间、人工检修周期等因素对主机处于工作状态下概率的影响。仿真试验表明:当主机处于工作状态的概率一定时,存在一个最佳自检周期和最佳人工检修周期。自检所花时间越短,主机处于工作状态的概率越大。采用最佳自检和人工检修周期可以进一步提高双机继电保护装置的可靠性,对设计具有高性能自检功能的继电保护装置具有科学指导意义。
Abstract:
For analyzing the influence of the self-checking periodand routine test interval on the reliability of dual relay protection based on host and backup, a dual machine switching state space model based on Markov process is constructed. The author quantitatively analyzed the influence of the self-checking period, routine test interval, Self-check time and other factors on thereliability of host that was at work under the state of dual machine switchingusing state space method. Simulation test showed that when the reliability of host(namely failure rate)was given, there was a optimum self-checking period andthe optimum routine test period. The shorter Self-check time, the higher the reliability of host at work. The selection of the optimum self-checking period andthe optimum routine test period resulted in the optimum reliability of dual relay protection, which has important reference significance for the design of relayprotection equipment with host and backup.

参考文献/References:

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备注/Memo

备注/Memo:
作者简介:张小鸣(1958-),男,安徽合肥人,博士,教授,研究方向为继电保护系统可靠性、嵌入式系统。
更新日期/Last Update: 2011-03-30